Gather all test-related into test mod. (privacy-scaling-explorations#…

…1300)

### Issue Link

* First mentioned in privacy-scaling-explorations#953 

* Pr link
This is the second pr for this. The older one privacy-scaling-explorations#1003 is abandoned as
there are too much conflicts.


### Contents
* Gather test related into test mod.
* Gather most of the `impl Circuit` into `dev.mod`
This is for distinct the `test-circuits` and the test features. privacy-scaling-explorations#1144

circuit-benchmarks/Cargo.toml

@@ -11,7 +11,7 @@ halo2_proofs = { git = "https://github.com/privacy-scaling-explorations/halo2.gi
 ark-std = { version = "0.3", features = ["print-trace"] }
 zkevm-circuits = { path = "../zkevm-circuits", features = ["test"]}
 keccak256 = { path = "../keccak256" }
-bus-mapping = { path = "../bus-mapping" }
+bus-mapping = { path = "../bus-mapping",  features = ["test"] }
 rand_xorshift = "0.3"
 rand = "0.8"
 itertools = "0.10"

circuit-benchmarks/src/bytecode_circuit.rs

@@ -25,7 +25,7 @@ mod tests {
     use std::env::var;
     use zkevm_circuits::bytecode_circuit::bytecode_unroller::{unroll, UnrolledBytecode};
 
-    use zkevm_circuits::bytecode_circuit::circuit::BytecodeCircuit;
+    use zkevm_circuits::bytecode_circuit::TestBytecodeCircuit;
 
     #[cfg_attr(not(feature = "benches"), ignore)]
     #[test]
@@ -51,7 +51,7 @@ mod tests {
         let bytecodes_num: usize = max_bytecode_row_num / bytecode_len;
 
         // Create the circuit
-        let bytecode_circuit = BytecodeCircuit::<Fr>::new(
+        let bytecode_circuit = TestBytecodeCircuit::<Fr>::new(
             fillup_codebytes(bytecodes_num, bytecode_len),
             2usize.pow(degree),
         );
@@ -88,7 +88,7 @@ mod tests {
             Challenge255<G1Affine>,
             XorShiftRng,
             Blake2bWrite<Vec<u8>, G1Affine, Challenge255<G1Affine>>,
-            BytecodeCircuit<Fr>,
+            TestBytecodeCircuit<Fr>,
         >(
             &general_params,
             &pk,

circuit-benchmarks/src/copy_circuit.rs

@@ -25,7 +25,7 @@ mod tests {
     use rand_xorshift::XorShiftRng;
     use std::env::var;
     use zkevm_circuits::{
-        copy_circuit::CopyCircuit,
+        copy_circuit::TestCopyCircuit,
         evm_circuit::witness::{block_convert, Block},
         util::SubCircuit,
     };
@@ -52,7 +52,7 @@ mod tests {
 
         // Create the circuit
         let block = generate_full_events_block(degree);
-        let circuit = CopyCircuit::<Fr>::new_from_block(&block);
+        let circuit = TestCopyCircuit::<Fr>::new_from_block(&block);
 
         // Bench setup generation
         let setup_message = format!("{} {} with degree = {}", BENCHMARK_ID, setup_prfx, degree);
@@ -79,7 +79,7 @@ mod tests {
             Challenge255<G1Affine>,
             XorShiftRng,
             Blake2bWrite<Vec<u8>, G1Affine, Challenge255<G1Affine>>,
-            CopyCircuit<Fr>,
+            TestCopyCircuit<Fr>,
         >(&general_params, &pk, &[circuit], &[], rng, &mut transcript)
         .expect("proof generation should not fail");
         let proof = transcript.finalize();

circuit-benchmarks/src/evm_circuit.rs

@@ -24,7 +24,7 @@ mod evm_circ_benches {
     use rand::SeedableRng;
     use rand_xorshift::XorShiftRng;
     use std::env::var;
-    use zkevm_circuits::evm_circuit::{witness::block_convert, EvmCircuit};
+    use zkevm_circuits::evm_circuit::{witness::block_convert, TestEvmCircuit};
 
     #[cfg_attr(not(feature = "benches"), ignore)]
     #[test]
@@ -56,7 +56,7 @@ mod evm_circ_benches {
 
         let block = block_convert(&builder.block, &builder.code_db).unwrap();
 
-        let circuit = EvmCircuit::<Fr>::new(block);
+        let circuit = TestEvmCircuit::<Fr>::new(block);
         let mut rng = XorShiftRng::from_seed([
             0x59, 0x62, 0xbe, 0x5d, 0x76, 0x3d, 0x31, 0x8d, 0x17, 0xdb, 0x37, 0x32, 0x54, 0x06,
             0xbc, 0xe5,
@@ -87,7 +87,7 @@ mod evm_circ_benches {
             Challenge255<G1Affine>,
             XorShiftRng,
             Blake2bWrite<Vec<u8>, G1Affine, Challenge255<G1Affine>>,
-            EvmCircuit<Fr>,
+            TestEvmCircuit<Fr>,
         >(
             &general_params,
             &pk,

circuit-benchmarks/src/exp_circuit.rs

@@ -27,7 +27,7 @@ mod tests {
     use std::env::var;
     use zkevm_circuits::{
         evm_circuit::witness::{block_convert, Block},
-        exp_circuit::ExpCircuit,
+        exp_circuit::TestExpCircuit,
     };
 
     #[cfg_attr(not(feature = "benches"), ignore)]
@@ -50,7 +50,7 @@ mod tests {
         let base = Word::from(132);
         let exponent = Word::from(27);
         let block = generate_full_events_block(degree, base, exponent);
-        let circuit = ExpCircuit::<Fr>::new(
+        let circuit = TestExpCircuit::<Fr>::new(
             block.exp_events.clone(),
             block.circuits_params.max_exp_steps,
         );
@@ -86,7 +86,7 @@ mod tests {
             Challenge255<G1Affine>,
             XorShiftRng,
             Blake2bWrite<Vec<u8>, G1Affine, Challenge255<G1Affine>>,
-            ExpCircuit<Fr>,
+            TestExpCircuit<Fr>,
         >(
             &general_params,
             &pk,

circuit-benchmarks/src/packed_multi_keccak.rs

@@ -21,7 +21,7 @@ mod tests {
     use rand::SeedableRng;
     use rand_xorshift::XorShiftRng;
     use std::env::var;
-    use zkevm_circuits::keccak_circuit::KeccakCircuit;
+    use zkevm_circuits::keccak_circuit::TestKeccakCircuit;
 
     #[cfg_attr(not(feature = "benches"), ignore)]
     #[test]
@@ -41,7 +41,7 @@ mod tests {
         let inputs = vec![(0u8..135).collect::<Vec<_>>(); 3];
 
         // Create the circuit. Leave last dozens of rows for blinding.
-        let circuit = KeccakCircuit::new(2usize.pow(degree) - 64, inputs);
+        let circuit = TestKeccakCircuit::new(2usize.pow(degree) - 64, inputs);
 
         // Initialize the polynomial commitment parameters
         let mut rng = XorShiftRng::from_seed([
@@ -74,7 +74,7 @@ mod tests {
             Challenge255<G1Affine>,
             XorShiftRng,
             Blake2bWrite<Vec<u8>, G1Affine, Challenge255<G1Affine>>,
-            KeccakCircuit<Fr>,
+            TestKeccakCircuit<Fr>,
         >(
             &general_params,
             &pk,

integration-tests/Cargo.toml

@@ -11,7 +11,7 @@ lazy_static = "1.4"
 ethers = { version = "0.17.0", features = ["ethers-solc"] }
 serde_json = "1.0.66"
 serde = { version = "1.0.130", features = ["derive"] }
-bus-mapping = { path = "../bus-mapping" }
+bus-mapping = { path = "../bus-mapping" , features = ["test"] }
 eth-types = { path = "../eth-types" }
 zkevm-circuits = { path = "../zkevm-circuits", features = ["test"] }
 tokio = { version = "1.13", features = ["macros", "rt-multi-thread"] }

integration-tests/src/integration_test_circuits.rs

@@ -28,14 +28,14 @@ use rand_xorshift::XorShiftRng;
 use std::{collections::HashMap, marker::PhantomData, sync::Mutex};
 use tokio::sync::Mutex as TokioMutex;
 use zkevm_circuits::{
-    bytecode_circuit::circuit::BytecodeCircuit,
-    copy_circuit::CopyCircuit,
-    evm_circuit::EvmCircuit,
-    exp_circuit::ExpCircuit,
-    keccak_circuit::KeccakCircuit,
-    state_circuit::StateCircuit,
+    bytecode_circuit::TestBytecodeCircuit,
+    copy_circuit::TestCopyCircuit,
+    evm_circuit::TestEvmCircuit,
+    exp_circuit::TestExpCircuit,
+    keccak_circuit::TestKeccakCircuit,
+    state_circuit::TestStateCircuit,
     super_circuit::SuperCircuit,
-    tx_circuit::TxCircuit,
+    tx_circuit::TestTxCircuit,
     util::SubCircuit,
     witness::{block_convert, Block},
 };
@@ -95,35 +95,35 @@ lazy_static! {
 
 lazy_static! {
     /// Integration test for EVM circuit
-    pub static ref EVM_CIRCUIT_TEST: TokioMutex<IntegrationTest<EvmCircuit<Fr>>> =
+    pub static ref EVM_CIRCUIT_TEST: TokioMutex<IntegrationTest<TestEvmCircuit<Fr>>> =
     TokioMutex::new(IntegrationTest::new("EVM", EVM_CIRCUIT_DEGREE));
 
     /// Integration test for State circuit
-    pub static ref STATE_CIRCUIT_TEST: TokioMutex<IntegrationTest<StateCircuit<Fr>>> =
+    pub static ref STATE_CIRCUIT_TEST: TokioMutex<IntegrationTest<TestStateCircuit<Fr>>> =
     TokioMutex::new(IntegrationTest::new("State", STATE_CIRCUIT_DEGREE));
 
     /// Integration test for State circuit
-    pub static ref TX_CIRCUIT_TEST: TokioMutex<IntegrationTest<TxCircuit<Fr>>> =
+    pub static ref TX_CIRCUIT_TEST: TokioMutex<IntegrationTest<TestTxCircuit<Fr>>> =
     TokioMutex::new(IntegrationTest::new("Tx", TX_CIRCUIT_DEGREE));
 
     /// Integration test for Bytecode circuit
-    pub static ref BYTECODE_CIRCUIT_TEST: TokioMutex<IntegrationTest<BytecodeCircuit<Fr>>> =
+    pub static ref BYTECODE_CIRCUIT_TEST: TokioMutex<IntegrationTest<TestBytecodeCircuit<Fr>>> =
     TokioMutex::new(IntegrationTest::new("Bytecode", BYTECODE_CIRCUIT_DEGREE));
 
     /// Integration test for Copy circuit
-    pub static ref COPY_CIRCUIT_TEST: TokioMutex<IntegrationTest<CopyCircuit<Fr>>> =
+    pub static ref COPY_CIRCUIT_TEST: TokioMutex<IntegrationTest<TestCopyCircuit<Fr>>> =
     TokioMutex::new(IntegrationTest::new("Copy", COPY_CIRCUIT_DEGREE));
 
     /// Integration test for Keccak circuit
-    pub static ref KECCAK_CIRCUIT_TEST: TokioMutex<IntegrationTest<KeccakCircuit<Fr>>> =
+    pub static ref KECCAK_CIRCUIT_TEST: TokioMutex<IntegrationTest<TestKeccakCircuit<Fr>>> =
     TokioMutex::new(IntegrationTest::new("Keccak", KECCAK_CIRCUIT_DEGREE));
 
     /// Integration test for Copy circuit
     pub static ref SUPER_CIRCUIT_TEST: TokioMutex<IntegrationTest<SuperCircuit::<Fr, MAX_TXS, MAX_CALLDATA, TEST_MOCK_RANDOMNESS>>> =
     TokioMutex::new(IntegrationTest::new("Super", SUPER_CIRCUIT_DEGREE));
 
      /// Integration test for Exp circuit
-     pub static ref EXP_CIRCUIT_TEST: TokioMutex<IntegrationTest<ExpCircuit::<Fr>>> =
+     pub static ref EXP_CIRCUIT_TEST: TokioMutex<IntegrationTest<TestExpCircuit::<Fr>>> =
      TokioMutex::new(IntegrationTest::new("Exp", EXP_CIRCUIT_DEGREE));
 }
 

zkevm-circuits/Cargo.toml

@@ -52,6 +52,6 @@ serde_json = "1.0.78"
 
 [features]
 default = []
-test = ["ethers-signers", "mock"]
+test = ["ethers-signers", "mock", "bus-mapping/test"]
 test-circuits = []
 warn-unimplemented = ["eth-types/warn-unimplemented"]

zkevm-circuits/src/bytecode_circuit.rs

@@ -4,7 +4,12 @@
 pub mod bytecode_unroller;
 /// Bytecode circuit
 pub mod circuit;
+pub(crate) mod param;
+
+#[cfg(any(feature = "test", test, feature = "test-circuits"))]
+mod dev;
 /// Bytecode circuit tester
 #[cfg(any(feature = "test", test))]
-pub mod dev;
-pub(crate) mod param;
+mod test;
+#[cfg(any(feature = "test", test, feature = "test-circuits"))]
+pub use dev::BytecodeCircuit as TestBytecodeCircuit;